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A wave refraction analysis for an axially symmetrical island.

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A wave refraction analysis for an axially symmetrical island.

by
Forst, Ronald J.

Publication date
Topics
Oceanography
Publisher
Texas A
Collection
navalpostgraduateschoollibrary; fedlink; americana
Contributor
Naval Postgraduate School, Dudley Knox Library
Language
en_US
Bibliography: p. 34-37

Thesis (M.S., Major subject: Oceanography)--Texas A & M University, 1966
Addeddate
2011-12-02 01:25:03
Call number
ocm5965981
Camera
Canon EOS 5D Mark II
Degree.discipline
Oceanography
Degree.grantor
Texas A
Degree.level
master's
Degree.name
M.S.in Oceanography
Description.service
U.S. Navy (U.S.N.) author.
External-identifier
urn:handle:10945/9673
urn:oclc:record:1102358262[WorldCat (this item)]
Foldoutcount
0
Identifier
waverefractionan00fors
Identifier-ark
ark:/13960/t25b14c7p
Full catalog record
MARCXML

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