Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
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Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
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Thesis (Ph. D.) --University of Florida, 1981
Vita
Bibliography: leaves 220-224
MATERIALS SCIENCE AND ENGINEERING Ph. D
psb
Thesis (Ph. D.) --University of Florida, 1981
Vita
Bibliography: leaves 220-224
MATERIALS SCIENCE AND ENGINEERING Ph. D
psb
- Addeddate
- 2010-03-08 15:49:42
- Call number
- 297676
- Camera
- Sheetfed Scanner
- External-identifier
- urn:oclc:record:1085091118
- Foldoutcount
- 0
- Identifier
- sensitivityoftwo00syke
- Identifier-ark
- ark:/13960/t2m625g1k
- Ocr_converted
- abbyy-to-hocr 1.1.37
- Ocr_module_version
- 0.0.21
- Openlibrary_edition
- OL24137296M
- Openlibrary_work
- OL16780459W
- Page-progression
- lr
- Page_number_confidence
- 89
- Page_number_module_version
- 1.0.3
- Pages
- 235
- Possible copyright status
- Copyright held by the author. Any reuse of this item in excess of fair use or other copyright exemptions requires permission of the copyright holder.
- Ppi
- 400
- Scandate
- 20100323175930
- Scanner
- info2.nj.archive.org
- Scanningcenter
- nj
- Worldcat (source edition)
- 8482591
- Full catalog record
- MARCXML
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University of Florida - Retrospective Dissertation Scanning Project University of Florida George A. Smathers Libraries American LibrariesUploaded by JoeOndreicka on